Highest Resolution Electrical Measurements
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Latest PrimeNano Publication in EDFA
Posted on November 6, 2017 by Amster
This latest publication of PrimeNano titled Curves for Advanced Characterization of Electrical Properties of Silicon and GaN Structures Using Scanning Microwave Impedance Microscopy (sMIM).
Day of sMIM Science at Caltech on November 9
Posted on September 26, 2017 by Amster
PrimeNano is pleased to announce a “Day of sMIM Science at Caltech" on Thursday Nov 9, 2017. The one day seminar will be held at the Kavli Nanoscience Institute.
PrimeNano End of 2017 Conference Schedule
Posted on September 25, 2017 by Amster
We have a very busy end of 2017, traveling all over the world. Here is PrimeNano's most up-to-date conference schedule for the end of this year. Come talk with us about your electrical measurement needs at one of these conferences.
PrimeNano Goes to APS March Meeting 2017
Posted on March 11, 2017 by Amster
PrimeNano will be once again presenting at the APS March Meeting. We will be giving a talk Wednesday afternoon Mar 15, at 5:18PM (P28.00013) in room 291: Using Scanning Microwave Impedance Microscopy (sMIM) to Characterize Defects in Dopants and Dielectrics in Semiconductor Devices.
PrimeNano Goes to Conferences 2017
Posted on March 6, 2017 by Amster
The following is PrimeNano's conference schedule this year. Come talk with us about your electrical measurement needs at one of these conferences.
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