Highest Resolution Electrical Measurements

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Doped Semiconductors

Examples of sMIM measurements on doped silicon, wide bandgap semiconductors, and other non-linear materials.

Materials Characterization

Example measurements on CNT’s, 2D materials, graphene, Ferroelectrics and, other advanced materials for research and development.

Nano-C-V Curves

Examples of local C-V measurements for semiconductor applications.

Quantitative Measurements

Examples of quantitative measurements for dielectric number, doping concentration, capacitance, and conductivity of high resistance metallic.

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