Highest Resolution Electrical Measurements

Materials Characterization

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Single Walled Carbon Nanotubes (CNT)

sMIM-R image of a single walled CNT’s using Bruker ICON AFM Peak Force Tapping mode.

7.5 nm HgTe/CdTe Quantum Well

MIM image of a 7.5 nm HgTe/CdTe quantum well at 4.7 K and 9 T. Surprisingly, the edge conduction, previously predicted to disappear in a magnetic field, persists. Scan size: 7 μm (Nature Communications 6, 7252 (2015) - http://www.nature.com/ncomms/2015/150526/ncomms8252/full/ncomms8252.html)

Pr(Sr0.1Ca0.9)2Mn2O7 Sample at Room Temperature

Overlaid topography, MIM and polarized light microscopy image of a Pr(Sr0.1Ca0.9)2Mn2O7 sample at room temperature, showing two distinct crystal twins and two charge-ordered phases with different conductivity. Scan size: 20 μm (Nature Communications 6, 7595 (2015) - http://www.nature.com/ncomms/2015/150703/ncomms8595/full/ncomms8595.html)

Polycrystalline Nd2Ir2O7 Sample

sMIM-C MIM image of a polycrystalline Nd2Ir2O7 sample at 4.7K, showing conductive magnetic domain walls. Scan size: 18 μm (Science 350, 538 (2015) - http://science.sciencemag.org/content/350/6260/538)

Graphene Moiré Pattern 100nm with Defect

sMIM-C image of Moiré pattern from graphene. The Moire pattern is created by the lattice mismatch between the graphene and unerlying h-BN film. The 100nm x 100nm area shows in detail the Moiré patterns. The hexagonal structures are 14.4 nm edge to edge in a very regular arrray. The image shows a missing sidewall of a single Moiré pattern feature highlighting the resolution quality of this data set. The ScanWave system was integrated on an Asylum Research MFP-3D. Sample was prepared by SIMIT, Shanghai courtesy of Dr. H. Wang.

Ferroelectric Ceramic (LiTaO3)

Data as art. In this image of LiTaO3 Ferroelectric domains, the sMIM-C image has the appearance of ancient cave art. LiTaO3 samples exibit local spontaneously polarized domain structures. ScanWave was used to image the domainsand correltate with other nano-mechanical imaging techniques.

Single layer Graphene on h-BN Film Deposited on a Quartz Substrate

Image is a 3D rendering of sMIM-R channel color overlaid on the topography. The sMIM-R signal shows diffences in the highly conductive graphene from the h-BN film and different grains of graphene in the imaged area. The sample was prepared by SIMIT of Shanghai, China courtesy of Dr. H Wang.

Carbon Nanotubes

Image of Carbon Nanotubes (CNTs) on insulating substrate. Color is sMIM-C signal overlaid on 3D topography. The sMIM signal shows variations in capacitance from different nanotubes. Seminconducting CNTs have similar capacitance as the substrate and appear green. Metallic CNT’s are more capacitive and appear blue.

Composite Material with Conductive Fibers

Image is a conductive fiber embedded in an insulating matrix. Aerospace, automotive, and industrial applications rely heavily on composite materials for improved mechanical and structural properties. Electrical properties of these composites are becoming increasingly important and optimizing these requires the ability to image conductive and insulating material systems. ScanWave, using sMIM, provides a non-destructive simplified imaging method for differentiating material types.

14.4 nm Moiré Pattern Graphene on h-BN

sMIM-C channel from a single layer of graphene deposited on a h-BN layer. The ScanWave was integrated on an Asylum Research MFP-3D AFM. The image shows two domains where the domain on the left has an orientation of the graphene carbon atoms with respect to the h-BN base layer that produces a well known interference pattern. The Moiré pattern visible in the image is made up of 14.4 nm hexagon structures. The domain on the right does not show the Moiré pattern. Sample was prepared by SIMIT, Shanghai courtesy of Dr. H. Wang.

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