mK LT SCANWAVE™ - ULTRA-LOW TEMPERATURE sMIM SYSTEM

Overview

PrimeNano’s mK ScanWave™ is an advanced, turnkey, industry robust solution. It provides an ultra-low temperature sMIM platform turnkey solution for frontier physics research (quantum effects, phase transitions, etc.) and novel materials studies (topological insulators, ferroelectrics, manganites, etc.). This system enables electrical characterization of materials at ultra-low temperatures and high magnetic field. This complete system solution reduces researchers time to have the right equipment to get to their core research.

 

The system comes equipped with the ScanWave™ sMIM electronics module, optical interferometer feedback Scanning Probe Microscopy for sMIM at mK temperature, top loading insert for fast sample/probe exchange, closed cycle cryostat, and superconducting magnets with computer-controlled interface. The system can be configured to have closed loop SPM scanner, multi-axis magnet up to 15T, etc.

mK ScanWave™ sMIM Electronics.

Right: mK scanning probe microscopy with laser optical interferometer feedback.

Left: top loading dilution refrigerator insert.

KEY FEATURES

  • Measure sub-micron variations in permittivity and conductivity ( ε & σ ) below 100 mK temperature and high B-Field.
  • Top loading for fast sample/probe exchange
  • Versatile operation modes including sMIM, sMIM dC/dV, sMIM C-V spectrum for electrical properties characterization.

BENEFITS

  • Commercial turnkey solution for ultra-low temp high magnetic field sMIM and SPM
  • Fast exchange of samples and/or scanning probe tips
  • Microscopy experiments in a cryogen-free, low vibration environment
  • Compatible with different AFM modes: contact, non-contact, constant height, constant force
  • Sub-surface measurement with high S/N ratio.

EXAMPLE USE CASES

  • Quantum computing
  • Solid state physics and quantum effects
    • Phase transitions
    • Topological Insulators
    • Quantum Hall effect
    • Quantum spin Hall effect
  • Material science researches
    • Ferroelectrics
    • Manganites
  • 1D/2D materials
    • Domain walls
    • Graphene

sMIM Image at mK Temperature

Simultaneous topographic (left) and sMIM (right) images at 91 mK on standard sMIM capacitor sample. These images show clear sMIM signal with high signal/noise ratio.

AFM image of sample with 19 nm height dots at 51 mK. Clear and sharp image from the low noise of SPM system.

Technical Specifications

General Specification

Technology

Cryostat

 

AFM

Electrical measurement

 

Scanning Microwave Impedance Microscopy (sMIM)

Dilution refrigerator cryostat with ultra-low vibration, designed for scanning probe microscopy applications

Cantilever based AFM with interferometric deflection detection

sMIM near field measurement with DC/AC bias

Cryostat Specifications*

Temperature range

Superconducting magnet

Sample environment

Sample exchange

Usability

 

 

70mK to 300K (depending on cryostat model and load)

9T (up to 12T optional), or 3D magnets

Vacuum

Top loading system for quick access

Fully automated temperature and magnetic field control, USB interface for remote control

AFM Specifications**

Imaging modes

z feedback

 

Sample positioning travel range

Scan size

Measured RMS z-noise (constant force @ 4 K, 5 ms pixel time)

Insert Titanium housing diameter

 

Contact mode, non-contact mode, constant height, constant force

PI feedback loop for amplitude modulation (AM), phase modulation (PM) or frequency modulation (FM) using included PLL

5 x 5 x 5 mm3 (coarse positioning stage)

50 x 50 x 24 μm3 @ 300 K, 30 x 30 x 15 μm3 @ 4 K

< 0.20 nm (expected), < 0.50 nm (guaranteed)

 

48mm

sMIM Specifications

Measured parameters

Operation temperature

RF Operation frequency

Probe diameter

Spatial resolution

Electrical resolution

Sub surface sensing

Microwave power to the tip

Bias

Probe

Compatible modes

 

S11, sMIM (C, R) sMIM-AC (dC/dV, dR/dV) Amp & Phase

70mK to 300K (depending on cryostat model and load)

3GHz (nominal)

<100nm

100nm (depend on sample)

1aF

Yes

-10dBm to -45dBm

+/-5V, DC-150kHz

Proprietary coax shielded probe

MFM, KPFM, PFM, & c-AFM

*    Cryostat specifications based on customized integration of sMIM insert.

**  AFM specifications based on customized sMIM SPM insert model.

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