Highest Resolution Electrical Measurements

Subscribe to Our Newsletter

ScanWave™ images electrical properties in nano-scale
Invitation to See PrimeNano in Pasadena, CA
Day of Science at Caltech Kavli Nanoscience Institute
Nov 9 (Thursday) | 10:00am - 3:00pm | KNI Seminar Room (Room 125)
Steele Building, Caltech Kavli Nanoscience Institute

The one day seminar will be held at the Kavli Nanoscience Institute. Our Director of Sales and Marketing, Oskar Amster, of PrimeNano, will give a presentation on Scanning Microwave Impedance Microscopy and Applications from 10:00 – 11:30am. After lunch Caltech has given PrimeNano access to the Bruker ICON AFM at the KNI. A system demonstration and customer sample imaging will take place from 12:00 – 3:00pm. Click here for more information.

Use the following button to register with Dan Kleinen by Nov 8, Wednesday, 12:00pm to get a head count for lunch, or email Dan at Daniel.Kleinen@primenanoinc.com

Register to Have Lunch with Us at Day of Science
ISTFA Technical Conference and Exhibition 
Nov 7 (Tuesday) | 1:45pm | Ballroom A 
Our Director of Sales and Marketing, Mr. Oskar Amster, will present Measurement of Dielectric constant and Doping Concentration of a Cross-sectioned Device by Quantitative Scanning Microwave Impedance Microscopy on Tuesday, Nov 7, 2017 at 1:45pm in Ballroom A (Pasadena Convention Center). Click here for more information.

Latest PrimeNano Publication in EDFA

This latest publication of PrimeNano, titled Curves for Advanced Characterization of Electrical Properties of Silicon and GaN Structures Using Scanning Microwave Impedance Microscopy (sMIM), can be found in Electronic Device Failure Analysis (EDFA), Volume 19 No. 4, EDFAAO (2017) 4:12-20. You can also download it here.



Copyright 2017. All Rights Reserved