Highest Resolution Electrical Measurements
Posted on April 15, 2019
ScanWave Pro™ offers breakthrough improvements for electrical measurements
Santa Clara, California – Apr 15, 2019 – PrimeNano proudly announces the launch of a new product line: ScanWave Pro™. Its 10x signal-to-noise improvement allows for measurements which have not been possible to date.
PrimeNano’s ScanWave™ Pro is a stand-alone module for most benchtop atomic force microscopes (AFMs). It enables nanoscale imaging of permittivity and conductivity of materials on the nanoscale. With our latest advancement in sMIM research, ScanWave™ Pro is bringing you significantly higher sensitivity and spatial resolution for electrical property imaging.
We have also made ScanWave™ Pro our most user-friendly system, thanks to the new tool-less probe holder and advanced probes.
ScanWave™ Pro features:
- 10 times signal-to-noise improvements
- 2 orders of magnitude better doping level concentrations measurements at low doping levels
- Significantly improved sub-surface resolution
- Better overall spatial resolution images
- Complete electronics redesign with breakthrough sensitivity (< 0.2 attofarad)
- ~ 7dB higher max. power output
-
Probe module mounting and Probe improvements:
- No tool probe module mounting on AFM
- High Precision shielded Probes with tighter tolerances
- Electrically optimized probe holders
Here is a comparison of ScanWave™ 1.5 and Pro in AC mode imaging of Carbon Nano Tubes (CNT) samples on sapphire. More examples are available on ScanWave™ Pro product page.
ScanWaveTM Pro
ScanWaveTM 1.5
Copyright 2024. All Rights Reserved