Highest Resolution Electrical Measurements

PrimeNano Proudly Announces Collaboration with CSInstruments

Posted on February 1, 2017 by Amster

 

ScanWave™ is now available on the

CSInstruments’ NanoObserver AFM

focused on advanced electrical measurements.

 

Santa Clara, California – February 1, 2017 – PrimeNano announces the addition of CSInstruments as a distributor of our ScanWave™ module in Europe. CSInstruments’ Nano-Observer has become the fastest growing AFM in France and the fastest growing brand AFM in Europe. PrimeNano is proud to extend ScanWave’s ™ support to this full featured and economical AFM focused on electrical measurements.

 

PrimeNano ScanWave™ is a stand-alone module for atomic force microscopes (AFMs) which is now fully compatible with CSInstruments’ Nano-Observer. It enables high resolution imaging of the permittivity and conductivity of materials at the nanoscale. ScanWave’s™ core scanning Microwave Impedance Microscopy (sMIM) technology, invented at Stanford University, allows visual examination of nanoscale electrical properties of any material.

 

PrimeNano’s ScanWave™ module is available now as an upgrade for CSInstruments’ Nano-Observer AFM. ScanWave™ sMIM methodology is compatible with all the traditional imaging modes including contact, non-contact, HD-KFM, ResiScope, and Soft ResiScope modes.

 

ScanWave™ sMIM is an electrical mode that measures a material’s change in permittivity and conductivity at the scale of an AFM probe tip.  By measuring the reflected microwave signal, sMIM detects the real and imaginary impedance (Re(Z) and Im(Z)) of the probe sample interface, capturing the variations in local permittivity and conductivity; for doped semiconductor materials, ScanWave™ sMIM can measure variations in doping concentrations and carrier type. The long-range sensitivity also allows measurement through surface layers to image buried structures.

 

The AFM community now has a new powerful combination for electrical measurements at the most economical price without compromising quality of data with PrimeNano’s ScanWave™ on CSIntruments’ Nano-Observer.

 

Click here for CSInstruments’ announcement.

 

Click to download this press release.