Latest PrimeNano Publication in EDFA

Posted on November 6, 2017 by Amster

 

This latest publication of PrimeNano titled Curves for Advanced Characterization of Electrical Properties of Silicon and GaN Structures Using Scanning Microwave Impedance Microscopy (sMIM).

Day of sMIM Science at Caltech on November 9

Posted on September 26, 2017 by Amster

 

PrimeNano is pleased to announce a “Day of sMIM Science at Caltech" on Thursday Nov 9, 2017. The one day seminar will be held at the Kavli Nanoscience Institute.

PrimeNano End of 2017 Conference Schedule

Posted on September 25, 2017 by Amster

 

We have a very busy end of 2017, traveling all over the world. Here is PrimeNano's most up-to-date conference schedule for the end of this year. Come talk with us about your electrical measurement needs at one of these conferences.

PrimeNano Goes to APS March Meeting 2017

Posted on March 11, 2017 by Amster

PrimeNano will be once again presenting at the APS March Meeting. We will be giving a talk Wednesday afternoon Mar 15, at 5:18PM (P28.00013) in room 291: Using Scanning Microwave Impedance Microscopy (sMIM) to Characterize Defects in Dopants and Dielectrics in Semiconductor Devices.

PrimeNano Goes to Conferences 2017

Posted on March 6, 2017 by Amster

 

The following is PrimeNano's conference schedule this year. Come talk with us about your electrical measurement needs at one of these conferences.

PrimeNano Launches its New Website for 2018

Posted on January 31, 2018 by Amster

 

We are excited to announce our new, updated, and improved website. The new website implemented a freshly designed navigation system to help you easily find information that matters to you.

Meet LT ScanWave™ at 2018 APS March Meeting

Posted on February 15, 2018 by Amster

 

PrimeNano will be once again presenting at the APS March Meeting. In the same conference we will also be launching our new Low Temperature ScanWave™ system in partnership with attocube.

PrimeNano Releases its Low Temperature sMIM System LT ScanWaveTM

Posted on February 5, 2018 by Amster

 

PrimeNano announces the expansion of its product line into the advanced physics, materials, and low-temperature device research communities with its low temperature high magnetic field platform, LT ScanWave™.

PrimeNano at IPFA 2018

Posted on June 13, 2018 by Amster

 

PrimeNano will be presenting at this year's International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA). IPFA 2018 will be hosted in the Sands Hotel in Singapore. Our Senior Director Worldwide Marketing, Oskar Amster, will be giving a talk on Nano C-V imaging of Semiconductor Devices with Scanning Microwave Impedance Microscopy.

AZoNano Interviews Our Senior Executive Eduard Weichselbaumer

Posted on March 23, 2021

In this interview, AZoNano talks to our Senior Executive Eduard Weichselbaumer about the work PrimeNano does in the Atomic Force Microscopy Field and the advances we are making.

Doping Level Measurements from Intrinsic Silicon to 1E20 atoms/cm3 Demonstrated

Posted on July 7, 2021

 

ScanWaveTM Pro can easily provide images of dopant concentration across any commonly used dopant levels from intrinsic silicon to degenerative levels (1E20 atoms/cm3). The sensitivity of ScanWaveTM Pro surpasses that of SIMS, the standard for dopant concentration measurements until now. Add to this that the response of ScanWaveTM is log-linear with respect to dopant levels and it becomes quite easy to predict the amount of active dopant.

 

ScanWave™ Pro achieves 1nm Resolution

Posted on July 8, 2021

 

ScanWave™ Pro achieves 1nm resolution as demonstrated in this recently published study: “The limits of near field immersion microwave microscopy evaluated by imaging bilayer graphene moiré patterns”. It was previously unknown what the ultimate resolution of ScanWaveTM could be and this work confirms a stunning discovery that will open up many more applications.

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