Highest Resolution Electrical Measurements

PrimeNano at 2018 APS March Meeting

Posted on February 15, 2018 by Amster

PrimeNano will be once again presenting at the APS March Meeting. Our Director Probes and China Sales Dr. Yongliang Yang will be giving a talk Thursday morning Mar 8 at 9:48PM (R01.00010) in LACC room 150A on "Cryogenic Imaging of Metal-insulator Transitions and Quantum Hall Edge States using Commercial Atomic Force Microscope with Scanning Microwave Impedance Microscopy (sMIM)".

 

Abstract

We report the instrumentation and experimental results of a cryogenic scanning microwave impedance microscope, which is now commercially available from PrimeNano Inc. The microwave probe, cryogenic amplifier, and positioning/scanning stages are located inside the variable temperature insert of a helium cryostat equipped with a superconducting magnet. Both contact mode and height-modulation mode scanning (using shielded cantilever probes) have been achieved. At temperatures down to 4 K and magnetic fields up to 9 T, the system has demonstrated the ability to spatially resolve the metal–insulator transition in a doped silicon sample, the quantum Hall edge states in graphene with a BN capping layer, and the conducting magnetic domain walls in polycrystalline Nd2Ir2O7. The data can be quantitatively analyzed by finite element simulation. Effects of the thermal energy and electric fields on local charge carriers can be seen in the images taken at different temperatures and dc biases. Electrical imaging in the microwave regime down to the liquid helium temperature opens up a new avenue to probe complex materials and phase transitions in the nanometer length scale under various conditions.

 

In the same conference we will also be launching our new Low Temperature ScanWave™

(LT ScanWave™) system in partnership with attocube. Come meet LT ScanWave™ at booth #312 and talk with the PrimeNano team regarding your own measurement requirements. To schedule an appointment, contact us.