Highest Resolution Electrical Measurements

PrimeNano Proudly Announces Bruker Nano Inc. as

New Addition to List of ScanWave™ Distributors

Posted on May 31, 2016 by Amster

 

ScanWave™ sMIM with PeakForce Mode

Provides Enhanced Nanoscale Mapping of

Permittivity and Conductivity

 

Palo Alto, California – May 15, 2016 – PrimeNano announces the addition of Bruker’s Nano Surfaces Division as a distributor of our ScanWave™ module for their extensive line of atomic force microscopes (AFM).

 

PrimeNano’s ScanWave™ is a stand-alone module for atomic force microscopes (AFMs). It enables high resolution imaging of the permittivity and conductivity of materials at the nanoscale. ScanWave’s™ core scanning Microwave Impedance Microscopy (sMIM) technology, invented at Stanford University, allows visual examination of nanoscale electrical properties of any material.

 

Bruker has released PrimeNano’s  ScanWave™ module as an upgrade for their Dimension Icon® and Edge atomic force microscope (AFM) platforms. ScanWave™ sMIM methodology is compatible with all the traditional imaging modes including contact, non-contact, Tapping®, and non-resonant modes such as PeakForce Tapping®.

 

ScanWave™ sMIM is a new electrical mode that measures a material’s change in permittivity and conductivity at the scale of an AFM probe tip.  By measuring the reflected microwave signal, sMIM detects the real and imaginary impedance (Re(Z) and Im(Z)) of the probe sample interface, capturing the variations in local permittivity and conductivity; for doped semiconductor materials, ScanWave™ sMIM can measure variations in doping concentrations and carrier type. The long range sensitivity also allows measurement through surface layers to image buried structures. sMIM measurements allow for up to six simultaneous channels to be captured in one measurement.

 

PrimeNano’s sMIM integration with Bruker’s PeakForce Tapping® dramatically expands the applications to simultaneous characterization of electrical and mechanical properties. In addition, the new PeakForce sMIM mode enables previously challenging measurements on fragile samples, such as nanotubes, nanowires, biological samples and is ideal for electrical characterization of 2D materials.

 

Click here to see Bruker’s announcement.