Highest Resolution Electrical Measurements
SCANWAVE 2.0™ - Latest ScanWaveTM
KEY FEATURES
- Replaces ScanWave 1.5™
- Release July 2020
- New robust industrial design
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Probe module mounting and probe improvements:
- No tool probe module mounting on AFM
- High precision shielded probes with tighter tolerances
- ~30% improved Signal to Noise Ratio over ScanWave 1.5™
BENEFITS
- Measure sub-micron variations in permittivity and conductivity ( ε & σ )
- Versatile operation modes including sMIM, sMIM dC/dV, sMIM C-V spectrum for electrical properties characterization
- High sensitivity measurements in AC mode and non-resonant AC mode operation such as Tapping, PeakForce tapping, Datacube etc.
- Fully supporting Bruker AFMs, Asylum MFP and cypher S and other industry standard AFM’s
Signal to Noise comparison for ScanWave 2.0TM vs ScanWave 1.5TM
For more information about ScanWaveTM 2.0, download our brochure or contact us using the buttons below.
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