ScanWave™ PROBE STORE

Long Probe

Coaxially shielded probes with solid metal probe tip to work with our ScanWave™ electronics module. Our long probe is recommended for contact mode measurements or on softer materials. Like our short probe, it supports non-resonant modes like force-distance imaging (aka Peak Force Tapping, Fast Force Mapping, or dual pass modes like lift mode).

Cantilever Specifications

Part number M300N
Spring k (N/m) 1 (0.8 – 1.2)
Freq (kHz) 19 (17 – 21)
Length (µm) 300 (295 – 305)
Width (µm) 50 (47 – 53)
Thickness (µm) 3.6 (3.3 – 3.9)
Shape Rectangular
Material Silicon nitride
Reflex Coating (nm) TiW/Au (500)

Tip Specifications

Tip radius (nm) 50 +/- 10
Tip height (µm) 5 +/- 0.5
Front angle (°) 35 +/- 1
Back angle (°) 35 +/- 1
Side angle (°) 35 +/- 1
Tip shape 4-sided
Tip material TiW
5-300N-01

Box of 1 probe

$291.50

5-300N-05

Box of 5 probes

$1,375.00

5-300N-10

Box of 10 probes

$2,640.000

5-300N-25

Box of 25 probes

$5,637.50

5-300N-50

Box of 50 probes

$10,725.00

Short Probe

Coaxially shielded probes with solid metal probe tip to work with our ScanWave™ electronics module. Our short cantilevers can be used for non-cpntact/tapping mode measurements and for contact mode on harder materials. Like our long probe, it supports non-resonant modes like force-distance imaging (aka Peak Force Tapping, Fast Force Mapping, or dual pass modes like lift mode).

Cantilever Specifications

Part numberM150N
Spring k (N/m) 8 (7 – 9)
Freq (kHz) 75 (70 – 80)
Length (µm) 150 (145 – 155)
Width (µm) 50 (47 – 53)
Thickness (µm) 3.6 (3.3 – 3.9)
Shape Rectangular
Material Silicon nitride
Reflex Coating (nm) TiW/Au (500)

Tip Specifications

Tip radius (nm) 50 +/- 10
Tip height (µm) 5 +/- 0.5
Front angle (°) 35 +/- 1
Back angle (°) 35 +/- 1
Side angle (°) 35 +/- 1
Tip shape 4-sided
Tip material TiW
5-150N-01

Box of 1 probe

$269.50

5-150N-05

Box of 5 probes

$1,210.00

5-150N-10

Box of 10 probes

$2,310.00

5-150N-25

Box of 25 probes

$5,500.00

5-150N-50

Box of 50 probes

$10,725.00

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