PrimeNano is pleased to announce that it has been awarded a “SBIR CHIPS for America” grant to develop a ScanWave™-based metrology solution.
PrimeNano Inc. announces the release of the new and improved version of ScanWave™ – ScanWave™ 1.5. Like its predecessor, is a stand-alone module for most benchtop atomic force microscopes (AFMs). It enables nanoscale imaging and measurements of the permittivity and conductivity of materials, but now with even more impressive capabilities. Recent advances include quantitative doping characterization of semiconductor devices.